PRODUCT |  Evolution™ 350

  •  Product name : Evolution™ 350
  •  Category : Spectrophotometer » Thermo Scientific
  •  Catalog : Evolution™_350_support.pdf


Evolution™ 350 UV-Vis Spectrophotometer, Cat. No. 840-310800

Designed for laboratories requiring higher performance, the Thermo Scientific™ Evolution™ 350 UV-Vis Spectrophotometer’s double beam optical design delivers precision and outstanding reliability for advanced applications. From sample to final report, intuitive software quickly guides you through each step of your analysis. Comprehensive tools for data collection, processing and reporting deliver the results you need for quantitative analysis, scanning and kinetics applications. Expansive accessory choices offer flexibility to analyze almost any sample type.


Specification :

Product Size


Baseline Flatness

±0.0015 A (200–800 nm)
2.0 nm SBW, smoothed


Evolution 350 Spectrophotometer

Detector Type

Dual Matched Silicon Photodiodes

Dimensions (L x W x H)

53 x 61 x 38 cm / 20.8 x 24 x 14.9 in.


<0.0005 Abs/hour, 500 nm, 2.0 nm SBW, 2 hr warm-up

Electrical Requirements

100–240 V, 50–60 Hz

For Use With (Application)

Academic, Chemicals, Food & Beverage, Chemicals Environmental, Industrial QA/QC, Material Science, Pharmaceuticals


Xenon Flash Lamp
Typical Lifetime: >5 years. Longer if not using live signal

Warranty Period: 3 year source replacement warranty



0A: <0.00018 A

1A: <0.00022 A

2A: <0.00050 A

500 nm, 2.0 nm SBW, RMS

Optical Design

Modified Ebert; Double beam with sample and reference cuvette/accessory positions

Pharmacopoeia Compliance Testing

Resolution (Toluene in Hexane) Peak/Trough Ratio >1.8 with 1nm slit setting

Photometric Accuracy (60mg/L K2Cr2O7) <±0.01 A relative to calibrated sealed standard

Stray Light <0.13 %T at 198 nm with KCl per EP

220 nm: <0.01%T NaI (behaves identically to KI for USP)

Wavelength Accuracy ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm

Wavelength Repeatability Peak separation of repetitive scanning of Hg line source <0.10 nm

Photometric Accuracy Instrument

1A: ±0.004 A

2A: ±0.004 A

3A: ±0.006 A


Measured at 546 nm using neutral density filters traceable to NIST. When testing instrument performance, the specification used for pass/fail determination is the sum of the instrument specification listed here and the uncertainty in the calibration data for the filter, listed on the calibration certificate.

Photometric Display

±6 A

Photometric Range

>4 A

Photometric Readout

Absorbance, % Transmission, % Reflectance, Kubelka-Munk, Log (1/R), Log(ABS), ABS x Factor, Intensity

Photometric Repeatability

1A: ±0.0025 A

Scan Ordinate Modes

Absorbance, % Transmittance, % Reflectance, Concentration, 1st–4th Derivative

Spectral Bandwidth

Variable 0.5, 1.0, 1.5, 2.0, 4.0 nm

Stray Light

198 nm: 2.9 A KCl

220 nm: 4.2 A NaI

340 nm: 4.3 A NaNO2

Wavelength Accuracy

±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm

Wavelength Data Interval

10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm

Wavelength Range

190–1100 nm

Wavelength Repeatability

Standard deviation of 10 measurements <0.05 nm

Wavelength Scan Speed

3800, 2400, 1200, 600, 240, 120, 60, 30, 10, 5, 1 nm/min


Weight (English)

48.5 lbs

Weight (Metric)

22 kg


Our Principal

Brookfield Ametek
Haver & Boecker
Ludwig Schneider